sonyneo: Get rid of a redundant test.
This commit is contained in:
parent
3cea30605f
commit
ed1c6d2227
|
@ -588,7 +588,7 @@ static int updneo_query_serno(struct libusb_device_handle *dev, uint8_t endp_up,
|
|||
return ret;
|
||||
}
|
||||
ptr = ctx.sts.scsno;
|
||||
while (*ptr && *ptr == 0x30) ptr++;
|
||||
while (*ptr == 0x30) ptr++;
|
||||
strncpy(buf, ptr, buf_len);
|
||||
buf[buf_len-1] = 0;
|
||||
|
||||
|
@ -632,7 +632,7 @@ static const char *sonyupdneo_prefixes[] = {
|
|||
|
||||
struct dyesub_backend sonyupdneo_backend = {
|
||||
.name = "Sony UP-D Neo",
|
||||
.version = "0.09",
|
||||
.version = "0.10",
|
||||
.uri_prefixes = sonyupdneo_prefixes,
|
||||
.cmdline_arg = updneo_cmdline_arg,
|
||||
.cmdline_usage = updneo_cmdline,
|
||||
|
|
Loading…
Reference in a new issue