sonyneo: Get rid of a redundant test.

This commit is contained in:
Solomon Peachy 2019-11-17 20:54:08 -05:00
parent 3cea30605f
commit ed1c6d2227

View file

@ -588,7 +588,7 @@ static int updneo_query_serno(struct libusb_device_handle *dev, uint8_t endp_up,
return ret;
}
ptr = ctx.sts.scsno;
while (*ptr && *ptr == 0x30) ptr++;
while (*ptr == 0x30) ptr++;
strncpy(buf, ptr, buf_len);
buf[buf_len-1] = 0;
@ -632,7 +632,7 @@ static const char *sonyupdneo_prefixes[] = {
struct dyesub_backend sonyupdneo_backend = {
.name = "Sony UP-D Neo",
.version = "0.09",
.version = "0.10",
.uri_prefixes = sonyupdneo_prefixes,
.cmdline_arg = updneo_cmdline_arg,
.cmdline_usage = updneo_cmdline,